HIOKI FA1811 複合式測試機
Package Board Testing Revolutionized Meeting ever increasing demands for greater analytical power, faster testing speeds and reduced costs.
- Achieve both high precision contact and high-speed probing in a space of □ 10um.
- Double test method delivers an operation rate of 100%.
- Improved operation software achieves a new level of operability.
- Combine with the latest probe to reduce impact marks.
- Added offset station and probe cleaning functions.
英文名稱FA1811 Flying Probe Tester