HIOKI FA1232-60/-61 測試機
Support for an extensive range of tests, from high-density FC-CSP boards to boards with active and passive embedded devices. Test performance that is fast, highly precise, and highly reliable.
- High throughput in a small footprint
- Rubust support for boards with active and passive embedded devices.
- Measuring mounted electronic components: Resistors, Capacitors, Inductance, Diodes, Zener diodes, Voltage/current, MLCCs (multilayer ceramic capacitors)
- Isolation and testing of composite components.
- Insulation testing with automatic protection of embedded components.
- High-current continutiy testing at up to 150mA.
- Hight-precision probing of fine-pitch boards.
英文名稱FA1232-60/-60 Bare Board Tester