HIOKI FA1116 電容式高密度飛針測試機
Now with newly developed low-impact probes and precision soft-landing control 30% faster cycle times for gold plating and fine pattern testing.
- High-Speed Testing at Up to 100 points/sec.
- Featuring newly designed probes and precision control for half the impact mark depth of previsous designs.
- Rapid testing, regardless of board type: Easily position the target board and start testing, even for thin-film boards and thick, round boards.
- High-speed pattern testing using capacitance measurement.
- Methods for calculating the number of test steps.
英文名稱FA1116 Flying Probe Tester