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HIOKI FA1283 高密度飞针测试机

1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.

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产品特色
  • Horizontal Double-Sided Flying Probe Tester 2 Upper Probes + 2 Lower Probes
  • Complete Electrical Testing of High-Function Boards with a Single Unit.
  • High-Speed Testing at up to 100 point/sec.
  • Significant expansion of the guaranteed range of low resistance and ultra-insulation testing.
  • Embedded Device Measurement: A Sharp Departure from LCR Measurement.
  • 1/2 Impact Mark Depth, High-Accuracy Probing, Low-Resistance Measurement, High-Speed 100 GΩ/250V Measurement, Vacuum Unit for Capacitance Test, Embedded Device Measurement.
产品信息
  • 原厂名称
    HIOKI
  • 制程名称
    测试/检查/品管篇
  • 英文名称
    FA1283 Flying Probe Tester
  • 产品细目
    测试机
连络窗口

若有任何需求,请与我们联系

  • 陆美娟
    • Tel : 0512-62560393 ext.716
    • Mail : Rainy_Lu@tkk.com.tw
  • 袁洁
    • Tel : 0769-81884787 ext:8020
    • Mail : Janet_Yuan@tkk.com.tw
  • 王黎明
    • Tel : 0512-62560393 ext.319
    • Mail : Frank_Wang@tkk.com.tw
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